Dr. Janusz Rajski

From the Mentor Graphics Corporation, San Jose, CA

Biographical sketch

Janusz Rajski is a Chief Scientist and Director of DFT Engineering at Mentor Graphics Corporation. He has published over 100 technical papers and holds seventeen US and international patents in the area of design for test. He is also the principal inventor of Embedded Deterministic Test (EDT™) technology and chief architect of the first commercial test compression product TestKompress™. Janusz received a number of awards including the 1993 Best Paper Award for a paper on logic synthesis published in IEEE Transactions on CAD, VTS 1995 and 1998 Best Paper Awards for papers on Embedded Test, and ITC 1999 and 2004 Honorable Mention Awards for papers on Logic BIST and Embedded Deterministic Test. In 2003 the President of Poland awarded the title of Professor of Sciences to Janusz for his fundamental contributions in the area of design and test of digital circuits and systems.